Estimating Error Propagation Probabilities with Bounded Variances

Authors:
Hossein Asadi;Mehdi B. Tahoori;Chandra Tirumurti
Affiliations:
Northeastern University Boston, MA;Northeastern University Boston, MA;Intel Corporation
Venue:
DFT '07 Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Year:
2007

Citing 0
Cited 3

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RASTER: runtime adaptive spatial/temporal error resiliency for embedded processors

Proceedings of the 50th Annual Design Automation Conference

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Abstract

Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system and cost-effective reliability improvements. In this paper we present an approach to obtain uncertainty bounds on the error propagation probability (EPP) values used in SER estimation based on an analytical approach. We demonstrate how we can compute EPP values and their uncertainty bounds (variances) by examining the logic gates in a topological order. Comparison of this method with the Monte-Carlo (MC) fault simulation approach confirms the accuracy of the presented technique for both the computed EPP values and uncertainty bounds. Also, this technique is 3-5 orders of magnitude faster than fault simulation.