A Nonlinear Feature Extraction Algorithm Using Distance Transformation

Authors:
W. L. G. Koontz;K. Fukunaga
Affiliations:
Bell Telephone Laboratories, Inc.;-
Venue:
IEEE Transactions on Computers
Year:
1972

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Pattern Recognition

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Abstract

Feature extraction has been recognized as a useful technique for pattern recognition. Feature extraction is accomplished by constructing a mapping from the measurement space to a feature space. Often, the mapping is chosen from an arbitrarily specified parametric family by optimizing the parameters with respect to a separability criterion.