An Efficient Algorithm for Generating Complete Test Sets for Combinational Logic Circuits
IEEE Transactions on Computers
Path Sensitization, Partial Boolean Difference, and Automated Fault Diagnosis
IEEE Transactions on Computers
Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences"
IEEE Transactions on Computers
Hi-index | 14.98 |
In the above paper1, the partial Boolean difference is defined and an algorithm for deriving complete minimal test input sequences for single-fault detection is given. In this correspondence, it is shown that the presentation of the algorithm is inadequate with respect to the need for multiple path sensitization. It is further shown that the computational procedure used in footnote 1 do