A random walk through software reliability theory

Authors:
P. G. Bishop;F. D. Pullen
Affiliations:
-;-
Venue:
Mathematical structures for software engineering
Year:
1991

Citing 0
Cited 1

A new tool for the modeling of AI and machine learning applications: random walk-jump processes

HAIS'11 Proceedings of the 6th international conference on Hybrid artificial intelligent systems - Volume Part I

Quantified Score

Hi-index	0.00

Visualization

Abstract