S. N. Maheshwari;S. L. Hakimi
Department of Electrical Engineering and Computer Science, Northwestern University;-
An Efficient Algorithm for Identifying the Most Likely Fault Set in a Probabilistically Diagnosable System
IEEE Transactions on Computers - The MIT Press scientific computation series
Dr. H. Fujiwara of Osaka University, Osaka, Japan, has brought to our attention two errors in the above paper.1