On a New Class of Bounds on Bayes Risk in Multihypothesis Pattern Recognition
IEEE Transactions on Computers
Some New Error Bounds and Approximations for Pattern Recognition
IEEE Transactions on Computers
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The distance measures and the information functions for feature selection are compared. The comparison is based on the available tight upper and lower bounds of the probability of misrecognition, the rates of change of such probability, the effectiveness of a feature subset, and the computational complexity.