Feature Selection with a Linear Dependence Measure

Authors:
S. K. Das
Affiliations:
Systems Development Div. IBM Corp.
Venue:
IEEE Transactions on Computers
Year:
1971

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Abstract

Features which are linearly dependent on other features do not contribute toward pattern classification by linear techniques. In order to detect the linearly dependent features, a measure of linear dependence is proposed. This measure is used as an aid in feature selection. Speaker verification experiments demonstrate the usefulness of employing such a measure in practice.