Comment on "When to Use Random Testing"

Authors:
P. B. Schneck
Affiliations:
Goddard Space Flight Center
Venue:
IEEE Transactions on Computers
Year:
1979

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Abstract

This correspondence indicates a weakness in forming the criteria used to decide when random testing is practical. The use of average fan-in based on total gate count is an oversimplification and results in too low a threshold for use of random testing in lieu of a complete test of 2N patterns. A modification is given to avoid this difficulty.