KIMS—a knowledge-based computer vision system for production line inspection
Computers and Industrial Engineering
Analytic and empirical assessment models of on-line inspection technologies
Proceedings of the 15th annual conference on Computers and industrial engineering
Agility of networked enterprises—parallelism, error recovery and conflict resolution
Computers in Industry - Special issue on advances in computer integrated production in honour of professor C.L. Moodie's retirement
Evaluation of agent-based manufacturing systems based on a parallel simulator
Computers and Industrial Engineering
A best-matching protocol for collaborative e-work and e-manufacturing
International Journal of Computer Integrated Manufacturing
A best-matching protocol for collaborative e-work and e-manufacturing
International Journal of Computer Integrated Manufacturing
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Supply networks can benefit from the development of effective exchange protocols to harmonize the integration of distributed machine-vision inspection information. By enabling local inspection information to be used beyond local supplier decisions and by integrating it with other suppliers' inspection information, an enterprise can garner better sub-assembly and supplier-matching decisions. An inspection information exchange architecture that enables best-matching has been developed. A parallel computer-based simulation using the teamwork integration evaluator (TIE 1.1) showed that a multiple-file-input logic had a relatively shorter processing time, exchange and handling time, than the pairwise-file-input logic for best-matching processes. The information exchange architecture enabled the comparison of suppliers based on quality of parts and cost to manufacture and aided in selecting the supplier, which better meets the needs of the customer. An Information Exchange Protocol: (1) enables better information exchange among manufacturing functions and (2) provides a decision-making tool for part dimensionality control.