Plagiarism analysis, authorship identification, and near-duplicate detection PAN'07

  • Authors:
  • Benno Stein;Moshe Koppel;Efstathios Stamatatos

  • Affiliations:
  • Bauhaus University Weimar;Bar-Ilan University, Israel;University of the Aegean, Greece

  • Venue:
  • ACM SIGIR Forum
  • Year:
  • 2007

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Abstract

Goal of the workshop was to bring together experts and prospective researchers around the exciting and future-oriented topic of plagiarism analysis, authorship identification, and high similarity search. This topic receives increasing attention, which results, among others, from the fact that information about nearly any subject can be found on the World Wide Web.