REPAS: Reliable Execution for Parallel ApplicationS in Tiled-CMPs
Euro-Par '09 Proceedings of the 15th International Euro-Par Conference on Parallel Processing
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As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability. Following an introduction by Antonio González, Scott Mahlke and Shubu Mukherjee debate whether reliability is a legitimate concern for the microarchitect. Topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.