Interoperability Test Generation for Communication Protocols based on Multiple Stimuli Principle
TestCom '02 Proceedings of the IFIP 14th International Conference on Testing Communicating Systems XIV
Bogor: an extensible and highly-modular software model checking framework
Proceedings of the 9th European software engineering conference held jointly with 11th ACM SIGSOFT international symposium on Foundations of software engineering
Fully automated interoperability test suite derivation for communication protocols
Computer Networks: The International Journal of Computer and Telecommunications Networking
Generating Efficient Test Sets with a Model Checker
SEFM '04 Proceedings of the Software Engineering and Formal Methods, Second International Conference
Model-Based Testing of Reactive Systems: Advanced Lectures (Lecture Notes in Computer Science)
Model-Based Testing of Reactive Systems: Advanced Lectures (Lecture Notes in Computer Science)
A Rigorous Approach to Requirements Validation
SEFM '06 Proceedings of the Fourth IEEE International Conference on Software Engineering and Formal Methods
Interoperability testing based on a fault model for a system of communicating FSMs
TestCom'03 Proceedings of the 15th IFIP international conference on Testing of communicating systems
Framework and model for automated interoperability test and its application to ROHC
TestCom'03 Proceedings of the 15th IFIP international conference on Testing of communicating systems
Formalizing interoperability testing: quiescence management and test generation
FORTE'05 Proceedings of the 25th IFIP WG 6.1 international conference on Formal Techniques for Networked and Distributed Systems
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Testing of consumer electronics (CE) devices for interoperability with respect to standards is an important validation activity. We have developed a model-based approach for producing interoperability tests based on a standards specification. This involves manually constructing individual device models in SAL, based on the standards, and using the sal-atg tool to generate tests from the composed system model. We describe this approach using an example standard. We also point out a problem with this approach, that has to do with variability in the devices due to optional and vendor-specific features. We propose an extension to the SAL language that addresses this problem. The extension is designed to enable the continued use of SAL tools for analysis purposes.