Control chart pattern recognition using semi-supervised learning

Authors:
Miin-Shen Yang;Jenn-Hwai Yang
Affiliations:
Department of Applied Mathematics, Chung Yuan Christian University, Taiwan;Department of Applied Mathematics, Chung Yuan Christian University, Taiwan
Venue:
ACS'07 Proceedings of the 7th Conference on 7th WSEAS International Conference on Applied Computer Science - Volume 7
Year:
2007

Citing 4
Cited 0

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Abstract

This paper presents a semi-supervised learning algorithm for a control chart pattern recognition system. A learning neural network is trained with labeled control chart patterns based on unsupervised learning. We then use the classification method based on a statistical correlation coefficient approach to test patterns. We find that the proposed semi-supervised learning algorithm is effective according to numerical comparisons.