A resistance deviation-to-time interval converter and its application to a passive RFID tag for security

  • Authors:
  • Jimann Park;Youngsoo Park;Youngsae Kim;Sungik Jun

  • Affiliations:
  • Wireless Security Application Research Team, ETRI, Yuseong-gu, Daejeon, Korea;Wireless Security Application Research Team, ETRI, Yuseong-gu, Daejeon, Korea;Wireless Security Application Research Team, ETRI, Yuseong-gu, Daejeon, Korea;Wireless Security Application Research Team, ETRI, Yuseong-gu, Daejeon, Korea

  • Venue:
  • ICC'07 Proceedings of the 11th Conference on Proceedings of the 11th WSEAS International Conference on Circuits - Volume 11
  • Year:
  • 2007

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Abstract

A passive RFID tag with security and measurement concepts is presented. The sensor interface module has a resistance deviation-to-time interval converter. The passive RFID tag embedded with a converter is described. A prototype RFID tag using a converter has been built with CMOS 0.35µm technology. The experimental results have shown that the tag has an 8 bits resolution and a linearity characteristic when the output pulse is counted by a 3.39 MHz clock. The proposed converter is insensitive to the pulse width change regardless of environment changes. The design principle and the circuit configuration are simple. The proposed converter is expected to find wide applications in the signal processing of various sensors.