A Bayesian approach to analysis of limit standards

  • Authors:
  • Roy R. Creasey, Jr.;K. Preston White, Jr.

  • Affiliations:
  • Longwood University, Farmville, VA;University of Virginia, Charlottesville, VA

  • Venue:
  • Proceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come
  • Year:
  • 2007

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Abstract

Limit standards are probabilistic requirements or benchmarks regarding the proportion of replications conforming or not conforming to a desired threshold. Sample proportions resulting from the analysis of replications are known to be beta distributed. As a result, standard constructs for defining a confidence interval on such a proportion, based on critical points from the normal or Student's t distribution, are increasingly inaccurate as the mean sample proportion approaches the limits of 0 or 1. We consider the Bayesian relationship between the beta and binomial distributions as the foundation for a sequential methodology in the analysis of limit standards. The benefits of using the beta distribution methodology are variance reduction, and smaller sample size (when compared to other analysis methodologies).