IEEE Transactions on Pattern Analysis and Machine Intelligence
Markov random fields for image modelling and analysis
Modelling and applications of stochastic processes
Modeling and Segmentation of Noisy and Textured Images Using Gibbs Random Fields
IEEE Transactions on Pattern Analysis and Machine Intelligence
IEEE Transactions on Pattern Analysis and Machine Intelligence
Robust Defect Segmentation in Woven Fabrics
CVPR '98 Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Comparative Evaluation of Texture Analysis Algorithms for Defect Inspection of Textile Products
ICPR '98 Proceedings of the 14th International Conference on Pattern Recognition-Volume 2 - Volume 2
TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces
IEEE Transactions on Pattern Analysis and Machine Intelligence
Fabric defect detection using modified local binary patterns
EURASIP Journal on Advances in Signal Processing
A hybrid model using genetic algorithm and neural network for classifying garment defects
Expert Systems with Applications: An International Journal
Stitching defect detection and classification using wavelet transform and BP neural network
Expert Systems with Applications: An International Journal
Textile Flaw Classification by Wavelet Reconstruction and BP Neural Network
ISNN 2009 Proceedings of the 6th International Symposium on Neural Networks: Advances in Neural Networks - Part II
Fabric defect classification using radial basis function network
Pattern Recognition Letters
Assessment of the influence of adaptive components in trainable surface inspection systems
Machine Vision and Applications - Integrated Imaging and Vision Techniques for Industrial Inspection
Texture classification using refined histogram
IEEE Transactions on Image Processing
Expert Systems with Applications: An International Journal
Fabric defect detection using local contrast deviations
Multimedia Tools and Applications
Review article: Automated fabric defect detection-A review
Image and Vision Computing
Rotation invariant texture characterization using a curvelet based descriptor
Pattern Recognition Letters
Texture exemplars for defect detection on random textures
ICAPR'05 Proceedings of the Third international conference on Pattern Recognition and Image Analysis - Volume Part II
Defect detection in random colour textures using the MIA t2 defect maps
ICIAR'06 Proceedings of the Third international conference on Image Analysis and Recognition - Volume Part II
Enhanced anomaly detection in wire ropes by combining structure and appearance
Pattern Recognition Letters
Global matching to enhance the strength of local intensity order pattern feature descriptor
ISNN'13 Proceedings of the 10th international conference on Advances in Neural Networks - Volume Part I
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The authors discuss the problem of textile fabric inspection using the visual textural properties of the fabric. The problem is to detect and locate the various kinds of defects that might be present in a given fabric sample based on an image of the fabric. Stochastic models are used to model the visual fabric texture. The authors use the Gaussian Markov random field to model the texture image of nondefective fabric. The inspection problem is cast as a statistical hypothesis testing problem on statistics derived from the model. The image of the fabric patch to be inspected is partitioned into nonoverlapping windows of size N*N where each window is classified as defective or nondefective based on a likelihood ratio test of size alpha . The test is recast in terms of the sufficient statistics associated with the model parameters. The sufficient statistics are easily computable for any sample. The authors generalize the test when the model parameters of the fabric are assumed to be unknown.