The feature extraction procedure for pattern recognition with learning using genetic algorithm

  • Authors:
  • Edward Puchala;Aleksander Rewak

  • Affiliations:
  • Wroclaw University of Technology, Faculty of Electronics, Wroclaw, Poland;Wroclaw University of Technology, Faculty of Electronics, Wroclaw, Poland

  • Venue:
  • SMO'07 Proceedings of the 7th WSEAS International Conference on Simulation, Modelling and Optimization
  • Year:
  • 2007

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Abstract

The paper deals with the extraction of features for statistical pattern recognition. In particular, the case of recognition with learning is considered. Bayes probability of correct classification is adopted as the extraction criterion. The problem with incomplete probabilistic information is discussed and Bayes-optimal feature extraction procedure is presented in detail. As method of solution of optimal feature extraction a genetic algorithm is proposed. A numerical example demonstrating quality of proposed algorithm to solve feature extraction problem is presented.