A detectability analysis of fault classes for Boolean specifications

Authors:
Zhenyu Chen;Baowen Xu;Changhai Nie
Affiliations:
Southeast University, Nanjing, China;Southeast University, Nanjing, China;Southeast University, Nanjing, China
Venue:
Proceedings of the 2008 ACM symposium on Applied computing
Year:
2008

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Abstract

The detectability hierarchies of fault classes for specification-based testing have been established to prioritize test cases so as to achieve earlier detection of more faults. This paper extends and complements the existing studies by analyzing detectability of fault classes for Boolean specifications in general form. The monotonicity of detectability is discovered that a fault occurs at literal is more difficult to detect than the corresponding one occurs at other positions. Furthermore, a strong detectability relationship is introduced to overcome the flaw of traditional approach. It can help identify stronger faults and skip weaker faults during testing. As a result, two detectability hierarchies are established on the detection conditions of fault classes.