Periodic comparison method for defects inspection of TFT-LCD panel

Authors:
Kyong-Min Lee;Moon Soo Chang;Poogyeon Park
Affiliations:
Division of Electrical and Computer Engineering, Pohang University of Science and Technology, Pohang, Korea;Division of Electrical and Computer Engineering, Pohang University of Science and Technology, Pohang, Korea;Division of Electrical and Computer Engineering, Pohang University of Science and Technology, Pohang, Korea
Venue:
ROCOM'07 Proceedings of the 7th WSEAS International Conference on Robotics, Control & Manufacturing Technology
Year:
2007

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Abstract

In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by poor illumination circumstances, and compare it with the reference pattern to inspect the arrangement of the pattern on the panel. Based on the reference frame, an error value image map that shows the distribution of defects is finally obtained. The simulation example shows that our algorithm not only inspects the LCD defects well, but also is robust to the 1-pixel error.