Selecting Software Test Data Using Data Flow Information
IEEE Transactions on Software Engineering
Constraint-Based Automatic Test Data Generation
IEEE Transactions on Software Engineering
PIE: A Dynamic Failure-Based Technique
IEEE Transactions on Software Engineering
Experimental results from an automatic test case generator
ACM Transactions on Software Engineering and Methodology (TOSEM)
Design for testability in object-oriented systems
Communications of the ACM
Software Testability: The New Verification
IEEE Software
An Analytic Software Testability Model
ATS '02 Proceedings of the 11th Asian Test Symposium
Testability Measurements for Data Flow Designs
METRICS '97 Proceedings of the 4th International Symposium on Software Metrics
Using Component Metacontent to Support the Regression Testing of Component-Based Software
ICSM '01 Proceedings of the IEEE International Conference on Software Maintenance (ICSM'01)
Automated-generating test case using UML statechart diagrams
SAICSIT '03 Proceedings of the 2003 annual research conference of the South African institute of computer scientists and information technologists on Enablement through technology
Generating tests from UML specifications
UML'99 Proceedings of the 2nd international conference on The unified modeling language: beyond the standard
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Testability is a quality factor used to predict the amount of effort required for software testing and to indicate the difficulty of revealing faults. This paper presents a quantitative testability analysis method for a software component that can be used when the source program is not available, but the bytecode is (as in Java .class files). This process analyzes the testability of each location to evaluate the component testability. The testability of a location is analyzed by computing the probability that the location will be executed and, if the location contains a fault, the execution will cause the fault to be revealed as a failure. This analysis process helps developers measure component testability and determine whether the component testability should be increased before the component is reused. In addition, low testability locations are identified.