A comparative analysis of the efficiency of change metrics and static code attributes for defect prediction

  • Authors:
  • Raimund Moser;Witold Pedrycz;Giancarlo Succi

  • Affiliations:
  • Free University of Bolzano-Bozen, Bolzano, Italy;University of Alberta, Edmonton, AB, Canada;Free University of Bolzano-Bozen, Bolzano, Italy

  • Venue:
  • Proceedings of the 30th international conference on Software engineering
  • Year:
  • 2008

Quantified Score

Hi-index 0.00

Visualization

Abstract

In this paper we present a comparative analysis of the predictive power of two different sets of metrics for defect prediction. We choose one set of product related and one set of process related software metrics and use them for classifying Java files of the Eclipse project as defective respective defect-free. Classification models are built using three common machine learners: logistic regression, Naïve Bayes, and decision trees. To allow different costs for prediction errors we perform cost-sensitive classification, which proves to be very successful: 75% percentage of correctly classified files, a recall of 80%, and a false positive rate