Fast and effective algorithms for graph partitioning and sparse-matrix ordering
IBM Journal of Research and Development - Special issue: optical lithography I
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In non destructive testing of materials, the recourse to the imagery allows, more than a convivial representation of the results, to carry out automatically the operations of detection, localisation and sizing of defects eventually present in a structure. The rapidity of the calculators and their graphic performances permit to use today classical tools of image processing which need voluminous quantities of calculations. Our work consists of applying the Hough transform to detect inclusions in a material by analysing an ultrasonic image type c-scan. In a first step, this image is binarized using the - 6dB method which reduce the defects to their real sizes. The Hough Transform is then applied on the edges in order to detect circular forms characterising the inclusions.