TEST: an effective automation tool for testing embedded software

Authors:
Changhyun Baek;Seungkyu Park;Kyunghee Choi
Affiliations:
Graduate School of Information and Communication, Ajou University, Suwon, Kyunggi, Republic Of Korea;Graduate School of Information and Communication, Ajou University, Suwon, Kyunggi, Republic Of Korea;Graduate School of Information and Communication, Ajou University, Suwon, Kyunggi, Republic Of Korea
Venue:
ICCOMP'05 Proceedings of the 9th WSEAS International Conference on Computers
Year:
2005

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Abstract

Much effort has been made to develop efficient tools for test automation of embedded software. To enhance higher level of test automation, so that errors are detected as early as possible, more comprehensive analytical measures should be taken to embedded systems. This paper presents a framework and implementation of an effective tool for test automation, in which Finite State Machine and Background Logic are adopted for modeling and the tool tests automatically analog and digital embedded systems. The tool aims to be more generic. The integrated tool, called TEST, is implemented to support all aspects occurring from modeling to test case generation. Applying TEST to actual applications shows a significant effectiveness in terms of finding errors and reducing time required to run the test.