Characterizing the I/O behavior of scientific applications on the Cray XT

  • Authors:
  • Philip C. Roth

  • Affiliations:
  • Oak Ridge National Laboratory, Oak Ridge, TN

  • Venue:
  • PDSW '07 Proceedings of the 2nd international workshop on Petascale data storage: held in conjunction with Supercomputing '07
  • Year:
  • 2007

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Abstract

Scientific applications use input/output (I/O) for obtaining initial conditions and execution parameters, as a persistent way of saving program output, and for safeguarding against system unreliability. Although system sizes are expected to continue increasing, I/O performance is not expected to keep pace with system computation and communication performance. Understanding application I/O demands and system I/O capabilities is the first step toward bridging this gap between them. In this paper, we present our approach for characterizing the I/O demands of applications on the Cray XT. We also present preliminary case studies showing the use of our I/O characterization infrastructure with climate studies and combustion simulation programs.