Achieving process analysis in TFT-LCD manufacturing industry by using statistical technique

Authors:
Kun-Lin Hsieh;Yen-Sheng Lu
Affiliations:
Department of Information Management & Research Group in Systemic and Theoretical Sciences, National Taitung University, Taitung, Taiwan, R.O.C.;Photondynamics Inc., Taiwan Branch Tainan Office, Yungkang City, Taiwan, R.O.C.
Venue:
ISTASC'06 Proceedings of the 6th WSEAS International Conference on Systems Theory & Scientific Computation
Year:
2006

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Abstract

Enhancing yield via detailed process analysis had become an important competitiveness determinant for thin film transistor-liquid crystal displays (TFT-LCD) factories. Until now, few studies were proposed to address the related issues for process analysis in TFT-LCD industry. Therefore, the process know-how, effect analysis or the improvement chances which are hidden behind process analysis will be frequently omitted. Hence, how to apply usedul techniques into analyzing the manufacturing processes will become an important issue to be addressed in TFT-LCD industry. In this study, we proposed a procedure based on statistical analysis technique to achieve the purpose. A real illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan will be applied to verifying the rationality and feasibility of our proposed procedure.