Measuring the risk-adjusted efficiency of Taiwan motor transport company before and after privatization

  • Authors:
  • Hsun-Jung Cho;Chih-Ku Fan

  • Affiliations:
  • Department of Transportation Technology and Management, National Chiao-Tung University, Hsinchu, Taiwan, R.O.C.;Department of Transportation Technology and Management, National Chiao-Tung University, Hsinchu, Taiwan, R.O.C.

  • Venue:
  • Math'04 Proceedings of the 5th WSEAS International Conference on Applied Mathematics
  • Year:
  • 2004

Quantified Score

Hi-index 0.00

Visualization

Abstract

High-k dielectric materials are being considered as replacement for SiO2 as the gate dielectric while retaining the low equivalent oxide thickness (EOT) required next generation metal oxide semiconductor field effect transistors (MOSFETs). ...