Quality assurance for TTCN-3 test specifications

  • Authors:
  • Helmut Neukirchen;Benjamin Zeiss;Jens Grabowski;Paul Baker;Dominic Evans

  • Affiliations:
  • Software Engineering for Distributed Systems Group, Institute for Computer Science, University of Göttingen, Germany;Software Engineering for Distributed Systems Group, Institute for Computer Science, University of Göttingen, Germany;Software Engineering for Distributed Systems Group, Institute for Computer Science, University of Göttingen, Germany;Motorola Labs, Basingstoke, U.K.;Motorola Labs, Basingstoke, U.K.

  • Venue:
  • Software Testing, Verification & Reliability - TAIC PART 2006 Special issue - Testing: Academic & Industrial Conference - Practice And Research Techniques
  • Year:
  • 2008

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Abstract

Comprehensive testing of modern communication systems often requires large and complex test suites, which have to be maintained throughout the system life cycle. Industrial experience, with those written using the standardized Testing and Test Control Notation (TTCN-3), has shown that this maintenance is a non-trivial task and its burden can be reduced by means of appropriate concepts and tool support. To this aim, Motorola has collaborated with the University of Göttingen to develop TRex, an open-source TTCN-3 development environment, which notably provides suitable metrics and refactorings to enable the assessment and automatic restructuring of test suites. This article presents concepts like metrics and refactoring for the quality assurance of TTCN-3 test suites and their implementation provided by the TRex tool. These means make it far easier to construct and maintain TTCN-3 tests that are concise and optimally balanced with respect to maintainability quality characteristics. Copyright © 2008 John Wiley & Sons, Ltd. This article is an extended version of the paper ‘TRex—The Refactoring and Metrics Tool for TTCN-3 Test Specifications’ by Paul Baker, Dominic Evans, Jens Grabowski, Helmut Neukirchen, and Benjamin Zeiss, which was originally presented at TAIC PART 2006 (Testing: Academic & Industrial Conference—Practice And Research Techniques).