Machine Learning Approach for Ontology Mapping Using Multiple Concept Similarity Measures

  • Authors:
  • Ryutaro Ichise

  • Affiliations:
  • -

  • Venue:
  • ICIS '08 Proceedings of the Seventh IEEE/ACIS International Conference on Computer and Information Science (icis 2008)
  • Year:
  • 2008

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Abstract

This paper presents a new framework for the ontology mapping problem. We organized the ontology mapping problem into a standard machine learning framework, which uses multiple concept similarity measures. We presented several concept similarity measures for the machine learning framework and conducted experiments for testing the framework using real-world data. Our experimental results show that our approach has increased performance with respect to precision, recall and F-measure in comparison with other methods.