Reverse Breakdown Voltage Measurement for Power P+NN+ Rectifier

  • Authors:

  • Guangyu Huang;Cher Ming Tan

  • Affiliations:

  • School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798;School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798

  • Venue:
  • Journal of Electronic Testing: Theory and Applications
  • Year:
  • 2008

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Abstract

The measurement of the reverse breakdown voltage for power rectifier is an important test. Two test methods for the reverse breakdown voltage measurement are employed in the industry, namely the forced voltage test (FVT) and the forced current test (FCT). In this work, we perform a systematic study to explain the different breakdown voltages obtained from the two test methods and the possible damage mechanisms to the device under test during FVT and FCT. The study shows that FVT has a much shorter test time while FCT is less destructive to the device under test.