Detection of Various Defects in TFT-LCD Polarizing Film

Authors:
Sang-Wook Sohn;Dae-Young Lee;Hun Choi;Jae-Won Suh;Hyeon-Deok Bae
Affiliations:
Dep. of Electrical Engineering, Chungbuk National University, Korea;RIUBIT, Korea;KRISS, Korea;Dep. of Electronic Engineering, Chungbuk National University, Korea;Dep. of Electrical Engineering, Chungbuk National University, Korea
Venue:
ICANNGA '07 Proceedings of the 8th international conference on Adaptive and Natural Computing Algorithms, Part II
Year:
2007

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Abstract

The increasing use of TFT-LCDs has generated a great deal of interest in manufacturing defects on TFT-LCD polarizing film because the poor quality of TFT-LCD polarizing film result in undesirable effects on the TFT-LCD display devices. In this paper, we propose a new inspection method that reliably detects various defects of TFT-LCD polarizing films. First, we apply a least mean squares adaptive filtering technique to remove background noise. Next, we use statistical characteristics to detect possible defects. Finally, we make a binary image to identify weather the TFT-LCD polarizing film has defects or not based on an adaptive threshold value. The performance of the proposed method has been evaluated on real TFT-LCD polarizing film samples.