Multiple-Instance Learning Improves CAD Detection of Masses in Digital Mammography

  • Authors:
  • Balaji Krishnapuram;Jonathan Stoeckel;Vikas Raykar;Bharat Rao;Philippe Bamberger;Eli Ratner;Nicolas Merlet;Inna Stainvas;Menahem Abramov;Alexandra Manevitch

  • Affiliations:
  • CAD and Knowledge Solutions (IKM CKS), Siemens Medical Solutions Inc., Malvern, USA 19355;Siemens Computer Aided Diagnosis Ltd., Jerusalem, Israel;CAD and Knowledge Solutions (IKM CKS), Siemens Medical Solutions Inc., Malvern, USA 19355;CAD and Knowledge Solutions (IKM CKS), Siemens Medical Solutions Inc., Malvern, USA 19355;Siemens Computer Aided Diagnosis Ltd., Jerusalem, Israel;Siemens Computer Aided Diagnosis Ltd., Jerusalem, Israel;Siemens Computer Aided Diagnosis Ltd., Jerusalem, Israel;Siemens Computer Aided Diagnosis Ltd., Jerusalem, Israel;Siemens Computer Aided Diagnosis Ltd., Jerusalem, Israel;Siemens Computer Aided Diagnosis Ltd., Jerusalem, Israel

  • Venue:
  • IWDM '08 Proceedings of the 9th international workshop on Digital Mammography
  • Year:
  • 2008

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Abstract

We propose a novel multiple-instance learning(MIL) algorithm for designing classifiers for use in computer aided detection(CAD). The proposed algorithm has 3 advantages over classical methods. First, unlike traditional learning algorithms that minimize the candidate level misclassification error, the proposed algorithm directly optimizes the patient-wise sensitivity. Second, this algorithm automatically selects a small subset of statistically useful features. Third, this algorithm is very fast, utilizes all of the available training data (without the need for cross-validation etc.), and requires no human hand tuning or intervention. Experimentally the algorithm is more accurate than state of the art support vector machine (SVM) classifier, and substantially reduces the number of features that have to be computed.