OP-ELM: Theory, Experiments and a Toolbox

  • Authors:
  • Yoan Miche;Antti Sorjamaa;Amaury Lendasse

  • Affiliations:
  • Department of Information and Computer Science, HUT, Finland and Gipsa-Lab, INPG, France;Department of Information and Computer Science, HUT, Finland;Department of Information and Computer Science, HUT, Finland

  • Venue:
  • ICANN '08 Proceedings of the 18th international conference on Artificial Neural Networks, Part I
  • Year:
  • 2008

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Abstract

This paper presents the Optimally-Pruned Extreme Learning Machine (OP-ELM) toolbox. This novel, fast and accurate methodology is applied to several regression and classification problems. The results are compared with widely known Multilayer Perceptron (MLP) and Least-Squares Support Vector Machine (LS-SVM) methods. As the experiments (regression and classification) demonstrate, the OP-ELM methodology is considerably faster than the MLP and the LS-SVM, while maintaining the accuracy in the same level. Finally, a toolbox performing the OP-ELM is introduced and instructions are presented.