Arbitrary Error Detection in Combinational Circuits by Using Partitioning

Authors:
Osnat Keren;Ilya Levin;Vladimir Ostrovsky;Beni Abramov
Affiliations:
-;-;-;-
Venue:
DFT '08 Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
Year:
2008

Citing 0
Cited 1

One-to-Many: Context-Oriented Code for Concurrent Error Detection

Journal of Electronic Testing: Theory and Applications

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Abstract

The paper presents a new technique for designing a concurrently checking combinational circuit. The technique is based on partitioning the circuit into two independent sub-circuits. It does not require any redundant coding variables; instead, it utilizes a sub-set of input variables. These variables are transferred directly into a checker providing the arbitrary error detection. The paper develops and studies a method for selecting an optimized sub-set of such variables. Benchmark results show eﬃciency of the proposed approach.