On-Line Failure Detection and Confinement in Caches

Authors:
Jaume Abella;Pedro Chaparro;Xavier Vera;Javier Carretero;Antonio González
Affiliations:
-;-;-;-;-
Venue:
IOLTS '08 Proceedings of the 2008 14th IEEE International On-Line Testing Symposium
Year:
2008

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Abstract

The objective of using logic BIST for online and periodic testing is to identify defects, like opens, resulting from the wear and tear of the circuit. We have shown that existing test sets have a low coverage for open defects located in scan flip-flops, ...