You can catch more bugs with transaction level honey

  • Authors:
  • Miron Abramovici;Kees Goossens;Bart Vermeulen;Jack Greenbaum;Neal Stollon;Adam Donlin

  • Affiliations:
  • DAFCA, Framingham, MA, USA;NXP Semiconductor, Netherlands;NXP Semiconductor, Netherlands;Greenhills Software, CA, USA;HDL Dynamics, TX, USA;Xilinx, San Jose, CA, USA

  • Venue:
  • CODES+ISSS '08 Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis
  • Year:
  • 2008

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Abstract

In this special session we explore holistic approaches to hardware/software debug that use or integrate transaction level models (TLMs). We present several TLM-based approaches to system-level diagnostics, ranging from use of most popular transaction level modeling languages through to hybrid technologies that combine TLMs with other well known diagnostic tools like in-silicon trace logic.