T-detector maturation algorithm with overlap rate

Authors:
Jungan Chen;Wenxin Chen;Feng Liang
Affiliations:
Electronic Information Department, Zhejiang Wanli University, Ningbo, Zhejiang, China;Electronic Information Department, Zhejiang Wanli University, Ningbo, Zhejiang, China;Electronic Information Department, Zhejiang Wanli University, Ningbo, Zhejiang, China
Venue:
WSEAS Transactions on Computers
Year:
2008

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Abstract

A parameter called overlap rate is proposed to control the number of valid detectors generated for a T-detector Maturation Algorithm. The achieved algorithm TMA-OR can reduce the number of detectors for abnormal detection. Experiment results show that TMA-OR is more effective than V-detector algorithms such as naive estimate and hypothesis testing method and can be applied on different data sets.