KleeNet: automatic bug hunting in sensor network applications

Authors:
Raimondas Sasnauskas;Jó Ágila Bitsch Link;Muhammad Hamad Alizai;Klaus Wehrle
Affiliations:
RWTH Aachen University, Aachen, Germany;RWTH Aachen University, Aachen, Germany;RWTH Aachen University, Aachen, Germany;RWTH Aachen University, Aachen, Germany
Venue:
Proceedings of the 6th ACM conference on Embedded network sensor systems
Year:
2008

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Software—Practice & Experience

KleeNet: discovering insidious interaction bugs in wireless sensor networks before deployment

Proceedings of the 9th ACM/IEEE International Conference on Information Processing in Sensor Networks

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Abstract

We present KleeNet, a Klee based bug hunting tool for sensor network applications before deployment. KleeNet automatically tests code for all possible inputs, ensures memory safety, and integrates well into TinyOS based application development life cycle, making it easy for developers to test their applications.