Probe-based ultrahigh-density storage technology

  • Authors:

  • A. Pantazi;A. Sebastian;T. A. Antonakopoulos;P. Bächtold;A. R. Bonaccio;J. Bonan;G. Cherubini;M. Despont;R. A. DiPietro;U. Drechsler;U. Dürig;B. Gotsmann;W. Häberle;C. Hagleitner;J. L. Hedrick;D. Jubin;A. Knoll;M. A. Lantz;J. Pentarakis;H. Pozidis;R. C. Pratt;H. Rothuizen;R. Stutz;M. varsamou;D. Wiesmann;E. Eleftheriou

  • Affiliations:

  • IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;Department of Electrical and Computers Engineering, University of Patras, Patras, Greece;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Systems and Technology Group, Essex Junction, Vermont;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Almaden Research Center, San Jose, CA;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Almaden Research Center, San Jose, CA;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;Department of Eletrical and Computer Engineering, University of Patras, Rio-Patras, Greecs;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland;IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland

  • Venue:
  • IBM Journal of Research and Development
  • Year:
  • 2008

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Abstract

Ultrahigh storage densities can be achieved by using a thermomechanical scanning-probe-based data-storage approach to write, read back, and erase data in very thin polymer films. High data rates are achieved by parallel operation of large two-dimensional arrays of cantilevers that can be batch fabricated by silicon-surface micromachining techniques. The very high precision required to navigate the storage medium relative to the array of probes is achieved by microelectromechanical system (MEMS)- based x and y actuators. The ultrahigh storage densities offered by probe-storage devices pose a significant challenge in terms of both control design for nanoscale positioning and read-channel design for reliable signal detection. Moreover, the high parallelism necessitates new dataflow architectures to ensure high performance and reliability of the system. In this paper, we present a small-scale prototype system of a storage device that we built based on scanning-probe technology. Experimental results of multiple sectors, recorded using multiple levers at 840 Gb/in2 and read back without errors, demonstrate the functionality of the prototype system. This is the first time a scanning-probe recording technology has reached this level of technical maturity, demonstrating the joint operation of all building blocks of a storage device.