Wavelet-based contourlet in quality evaluation of digital images

  • Authors:
  • Xinbo Gao;Wen Lu;Xuelong Li;Dacheng Tao

  • Affiliations:
  • School of Electronic Engineering, Xidian University, Xi'an 710071, China;School of Electronic Engineering, Xidian University, Xi'an 710071, China;School of Computer Science and Information Systems, Birkbeck, University of London, London WC1E 7HX, UK;Biometrics Research Centre, Department of Computing, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong

  • Venue:
  • Neurocomputing
  • Year:
  • 2008

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Abstract

Feature extraction is probably the most important stage in image quality evaluation-effective features can well reflect the quality of digital images and vice versa. As a non-redundant sparse representation, contourlet transform can effectively reflect visual characteristics of images, and it can be employed to perceptually capture the difference between images. Motivated by this, this paper first proposes an objective reduced-reference image quality evaluation metric based on contourlet transform. Experiments demonstrate that this new objective metric achieves consistent image quality evaluation results with what gained by subjective evaluation.