An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process

Authors:
Chern-Sheng Lin;Kuo-Hon Huang;Yun-Long Lay;Kuo-Chun Wu;Yieng-Chiang Wu;Jim-Min Lin
Affiliations:
Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan;Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan;Department of Electronic Engineering, National Chinyi Institute of Technology, Taichung, Taiwan;Department of Information Engineering and Computer Science, Feng Chia University, Taichung, Taiwan;Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan;Department of Information Engineering and Computer Science, Feng Chia University, Taichung, Taiwan
Venue:
Expert Systems with Applications: An International Journal
Year:
2009

Citing 1
Cited 1

Morphological operators for image and video compression

IEEE Transactions on Image Processing

Measurement method of three-dimensional profiles of small lens with gratings projection and a flexible compensation system

Expert Systems with Applications: An International Journal

Quantified Score

Hi-index	12.05

Visualization

Abstract

This research examines the electrical conductive particles of anisotropic conductive film (ACF) during the laminate manufacturing process for liquid crystal displays (LCD) and adopts an improved pattern match method to apply on-line automatic and relevant measurement inspections. The focus of this research is describing and identifying feature images. We aim to improve the traditional pattern match methods including the gray scale designs, adaptive pattern matrix, and adaptive feature weight pattern to reduce the system function errors and to enable more efficient and quicker pattern searches and matches for full-size images.