Computers and Electronics in Agriculture
Using classifier-based nominal imputation to improve machine learning
PAKDD'11 Proceedings of the 15th Pacific-Asia conference on Advances in knowledge discovery and data mining - Volume Part I
Expert Systems with Applications: An International Journal
Bayesian multiple imputation approaches for one-class classification
Canadian AI'12 Proceedings of the 25th Canadian conference on Advances in Artificial Intelligence
| Hi-index | 0.00 |
It is difficult to learn good classifiers when training data is missing attribute values. Conventional techniques for dealing with such omissions, such as mean imputation, generally do not significantly improve the performance of the resulting classifier. We proposed imputation-helped classifiers, which use accurate imputation techniques, such as Bayesian multiple imputation (BMI), predictive mean matching (PMM), and Expectation Maximization (EM), as preprocessors for conventional machine learning algorithms. Our empirical results show that EM-helped and BMI-helped classifiers work effectively when the data is "missing completely at random", generally improving predictive performance over most of the original machine learned classifiers we investigated.