Deriving distance metrics from generality relations

  • Authors:
  • Luc De Raedt;Jan Ramon

  • Affiliations:
  • Department of Computer Science, Katholieke Universiteit Leuven, Celestijnenlaan 200A, BE-3001 Heverlee, Belgium;Department of Computer Science, Katholieke Universiteit Leuven, Celestijnenlaan 200A, BE-3001 Heverlee, Belgium

  • Venue:
  • Pattern Recognition Letters
  • Year:
  • 2009

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Abstract

Many pattern recognition and machine learning approaches employ a distance metric on patterns, or a generality relation to partially order the patterns. We investigate the relationship amongst them and prove a theorem that shows how a distance metric can be derived from a partial order (and a corresponding size on patterns) under mild conditions. We then discuss the use of the theorem. More specifically, we show how well-known distance metrics for sets, strings, trees and graphs can be derived from their generality relation.