Multiband automatic test equipment: a computer controlled check-out system

  • Authors:

  • Teruhisa Kuroda;Thomas C. Bush

  • Affiliations:

  • McKinsey & Company, Inc., New York, New York;Sanders Associates, Inc., Plainview, New York

  • Venue:
  • AFIPS '71 (Spring) Proceedings of the May 18-20, 1971, spring joint computer conference
  • Year:
  • 1971

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Abstract

The major problem facing organizations using electronic devices is in test and maintenance of the equipment. Due to the high cost of the equipment and demands made on its maximum utilization, fast and reliable testing procedures are required to minimize downtime for repair and calibration.