Three-Dimensional Shape Measurement Using Maar Wavelet Transform

  • Authors:

  • Xiang Zhou;Hong Zhao

  • Affiliations:

  • State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China 710049;State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China 710049

  • Venue:
  • ICIRA '08 Proceedings of the First International Conference on Intelligent Robotics and Applications: Part I
  • Year:
  • 2008

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Abstract

A new method based on wavelet transform for three-dimensional shape measurement is presented. A sinusoidal grating pattern is projected onto the object surface and Maar wavelet is chosen to perform continuous wavelet transform of the pattern. The phase distribution is recovered from the coefficients on the ridge of the transforrm after converting original signal into the analytic form. Compared to the method employing Morlet wavelet transform, the new method has higher accuracy both in the neighborhood of the height-discontinuous points and in the areas with height sharply varying. The numerical simulation and experiment have proved the validity of this method.