Measuring Distances for Ontology-Based Systems

Authors:
Steffen Mencke;Cornelius Wille;Reiner Dumke
Affiliations:
Otto-von-Guericke University of Magdeburg,;University of Applied Sciences Bingen,;Otto-von-Guericke University of Magdeburg,
Venue:
IWSM/Metrikon/Mensura '08 Proceedings of the International Conferences on Software Process and Product Measurement
Year:
2008

Citing 3
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A translation approach to portable ontology specifications

Knowledge Acquisition - Special issue: Current issues in knowledge modeling
What Are Ontologies, and Why Do We Need Them?

IEEE Intelligent Systems
Semantic Web and Education (Integrated Series in Information Systems)

Semantic Web and Education (Integrated Series in Information Systems)

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Abstract

Nowadays, measurement and assessment of artifacts within the area of software development are of high concern for scientific institutions. With the increasing usage of the Web 2.0, together with service-oriented applications, the importance of Web-based systems is still growing. Ontologies as a fundamental concept of the Semantic Web as envisioned by Tim Berners-Lee, play an important role for current and future applications. To promote the high flexibility of this technology for international dynamics, additional concepts for the Semantic Web are necessary. Ontology metrics are used to measure certain aspects of ontologies. In this paper, a set of novel distance metrics is introduced and their applicability is proven by the presentation of an example.