Bagging, Random Subspace Method and Biding

Authors:
Satoshi Shirai;Mineichi Kudo;Atsuyoshi Nakamura
Affiliations:
Division of Computer Science Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan 060-0814;Division of Computer Science Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan 060-0814;Division of Computer Science Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan 060-0814
Venue:
SSPR & SPR '08 Proceedings of the 2008 Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition
Year:
2008

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Abstract

In recent years, many approaches for achieving high performance by combining some classifiers have been proposed. We exploit many random replicates of samples in the bagging, and randomly chosen feature subsets in the random subspace method. In this paper, we introduce a method for selecting both samples and features at the same time and demonstrate the effectiveness of the method. This method includes a parametric bagging and a parametric random subspace method as special cases. In some experiments, this method and the parametric random subspace method showed the best performance.