Fully dynamic planarity testing (extended abstract)

  • Authors:
  • Zvi Galil;Giuseppe F. Italiano;Neil Sarnak

  • Affiliations:
  • Department of Computer Science, Columbia University, and Tel-Aviv University;IBM T. J. Watson Research Center, P.O. Box 704, Yorktown, Heights, NY and Università di Roma, Italy;IBM T. J. Watson Research Center, P.O. Box 704, Yorktown, Heights, NY

  • Venue:
  • STOC '92 Proceedings of the twenty-fourth annual ACM symposium on Theory of computing
  • Year:
  • 1992

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Abstract