Imaging convex quadrilateral inclusions in uniform conductors from electrical boundary measurements

Authors:
Debasish Roy;Geoff Nicholls;Colin Fox
Affiliations:
Mathematics Department, Auckland University, Auckland, New Zealand;Statistics Department, Oxford University, Oxford, UK OX1 3TG;Mathematics Department, Auckland University, Auckland, New Zealand
Venue:
Statistics and Computing
Year:
2009

Citing 4
Cited 0

Effects of measurement precision and finite numbers of electrodes on linear impedance imaging algorithms

SIAM Journal on Applied Mathematics
Existence and uniqueness for electrode models for electric current computed tomography

SIAM Journal on Applied Mathematics
Direct Reconstructions of Conductivities from Boundary Measurements

SIAM Journal on Scientific Computing
Numerical solution method for the dbar-equation in the plane

Journal of Computational Physics

Quantified Score

Hi-index	0.00

Visualization

Abstract

We demonstrate simulation-based Bayesian imaging from electrical impedance tomographic data, by summarizing the set of conductance images which could give rise to the data. The forward map from conductance image to data requires the solution of a partial differential equation subject to boundary conditions. We develop the example of recovering an unknown convex polygonal insulating inclusion within an object made of otherwise uniformly conducting material, and illustrate our methods with noisy synthetic data. Sampling is carried out using Markov chain Monte Carlo with the efficiency of the algorithm investigated over a range of noise levels.