Neural network analysis of nondestructive evaluation patterns

Authors:
W. E. Bond;D. C. St. Clair;M. M. Amirfathi;C. J. Merz;S. Aylward
Affiliations:
McDonnell Douglas Research Laboratories;University of Missouri-Rolla, Engineering Education Center;Douglas Aircraft Company;McDonnell Aircraft Company;McDonnell Aircraft Company
Venue:
SAC '92 Proceedings of the 1992 ACM/SIGAPP symposium on Applied computing: technological challenges of the 1990's
Year:
1992

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Abstract