Dependable VLSI: device, design and architecture: how should they cooperate?

  • Authors:

  • Shuichi Sakai;Hidetoshi Onodera;Hiroto Yasuura;James C. Hoe

  • Affiliations:

  • The University of Tokyo, Bunkyo-ku, Tokyo, Japan;Kyoto University, Kyoto, Japan;Kyusyu University, Nishi-ku Fukuoka, Japan;Carnegie Mellon University

  • Venue:
  • Proceedings of the 2009 Asia and South Pacific Design Automation Conference
  • Year:
  • 2009

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Abstract

VLSI dependability is one of the most significant issues in the modern world. Here the panelists will discuss the key technologies for it as well as the cost optimization among device, design and architecture.